Computed electron micrographs and defect identification / A. K. Head ... [et al.]

Contributor(s):

Series: Defects in crystalline solids ; vol. 7Publication details: Amsterdam : North-Holland, 1973Description: x, 400 ; 23 cmISBN:

Subject(s):

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QD921.C64 (Browse shelf(Opens below))		1	Available		00000287804

There are no comments on this title.

to post a comment.