Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [electronic resource] : 2nd Edition / edited by Manoj Sachdev, Jose Pineda de Gyvez.

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Series: Frontiers in Electronic Testing ; 34Publication details: Boston, MA : Springer, 2007.Description: 328 p. : ill., digital ; 24 cmISBN:

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In: Springer e-books

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Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	ebooks (Browse shelf(Opens below))		1	Available

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