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Physical measurement and analysis of thin films/ edited by E. M. Murt and W. G. Guldner.

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Publication details: New York: Plenum Press, 1969.Description: xi, 194 p. : ill. ; 24 cmSubject(s):

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QC176.E2 1976 (Browse shelf(Opens below))		Available		00000422415

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