Thin film analysis by x-ray scattering / Mario Birkholz ; with contributions by Paul F. Fewster, Christoph Genzel.

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Publication details: Weinheim : Wiley-VCH, 2006.Description: xxii, 356 p. : ill. ; 25 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QC176.83.B57 (Browse shelf(Opens below))		1	Available		00001471307

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