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Synthetic Polymeric Membranes [electronic resource] : Characterization by Atomic Force Microscopy / by K. C. Khulbe, C. Y. Feng, Takeshi Matsuura.

By: Contributor(s): Series: Springer LaboratoryPublication details: Berlin, Heidelberg : Springer-Verlag, 2008.Description: xvii, 197 p. : ill., digital ; 24 cmISBN:
  • 9783540739944 (electronic bk.)
  • 9783540739937 (paper)
Subject(s): DDC classification:
  • 660.2842 22
LOC classification:
  • TP159.M4 K48 2008
Online resources: In: Springer eBooks
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