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	1.	No cover image available Fundamentals of surface and thin film analysis / by Leonard G. Feldman and James W. Mayer by Feldman, Leonard C Mayer, J. W. (James W.), 1930- Publication details: New York : North-Holland, 1986 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QD506.F39. Place hold
	2.	Fundamentals of nanoscale film analysis / Terry L. Alford, Leonard C. Feldman and James W. Mayer by Alford, Terry L Feldman, Leonard C Mayer, James W, 1930- Publication details: New York, N.Y. : Springer, 2007 Online resources: Table of contents only Availability: Items available for loan: PERPUSTAKAAN DR ABDUL LATIFF (1)Call number: QC176.83.A4316f 2007 9. PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC176.83.A445. Place hold
	3.	Fundamentals of Nanoscale Film Analysis [electronic resource] / by Terry L. Alford, Leonard C. Feldman, James W. Mayer. by Alford, Terry L Feldman, Leonard C Mayer, James W SpringerLink (Online service) Publication details: Boston, MA : Springer Science+Business Media, Inc., 2007 In: Springer e-books Online resources: Click here to access online Availability: No items available.

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