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Physical Principles of Electron Microscopy [electronic resource] : An Introduction to TEM, SEM, and AEM / by Ray F. Egerton.

By: Contributor(s): Publication details: Boston, MA : Springer Science+Business Media, Inc., 2005.Description: xii, 202 p. : ill., digital ; 25 cmISBN:
  • 9780387260167 (electronic bk.)
  • 9780387258003 (paper)
Subject(s): DDC classification:
  • 502.825 22
LOC classification:
  • QH212.E4 E354 2005
Online resources: In: Springer e-books
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