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Design for Manufacturability and Yield for Nano-Scale CMOS [electronic resource] / by Charles C. Chiang, Jamil Kawa.
Series: Series on Integrated Circuits and SystemsPublication details: Dordrecht : Springer, 2007.Description: 154 p. : ill., digital ; 24 cmISBN:- 9781402051883 (electronic bk.)
- 621.38 22
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