Reliability modeling with applications : essays in honor of Professor Toshio Nakagawa on his 70th birthday / editors : Syouji Nakamura, Cun Hua Qian, Mingchih Chen.
Publisher: Singapore : World Scientific Pub. Co., [2014]Copyright date: 2014Description: xiv, 364 pages : illustrations ; 24 cmContent type:- text
- unmediated
- volume
- 9789814571937
- 9814571938
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | - | TA169.R458 3 (Browse shelf(Opens below)) | 1 | Available | 00002116561 |
Includes bibliographical references.
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