Neural models and algorithms for digital testing / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell.

By:

Contributor(s):

Publication details: Boston : Kluwer Academic Publishers, 1991.Description: 184 p. : ill. ; 24 cmISBN:

Subject(s):

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	TK7868.L6 C44 (Browse shelf(Opens below))		1	Available		00000815184

There are no comments on this title.

to post a comment.

Back to results