Intelligent testing, control and decision-making for space launch / Yi Chai, Shangfu Li.
Publisher: Singapore : National Defense Industry Press ; Hoboken, New Jersey : John Wiley & Sons, 2015Description: xiii, 271 pages : illustrations ; 25 cmContent type:- text
- unmediated
- volume
- 9781118889985
| Item type | Current library | Home library | Collection | Call number | Materials specified | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|---|---|
| AM | PERPUSTAKAAN LINGKUNGAN KEDUA | PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA | - | TL3250.C435 3 (Browse shelf(Opens below)) | 1 | Available | 00002192716 |
Includes bibliographical references and index.
Overview of testing and control for space launch -- Networks of testing and control for space launch -- Intelligent analysis and processing for testing data -- Intelligent fault diagnosis for space launch and testing -- Safety control of space launch and flight : modeling and intelligence decision -- Development tendency of space launch test and control.
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