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	1.	Functional equations in applied sciences / Enrique Castillo, Andres Iglesias, Reyes Ruiz-Cobo by Castillo, Enrique, 1946- Iglesias, Andres Ruiz-Cobo, Maria Reyes, 1966- Series: Mathematics in science and engineering ; v. 199 Publication details: Amsterdam : Elsevier, 2005 Online resources: Table of contents Publisher description Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QA431.C378. Place hold
	2.	Bayesian process monitoring, control and optimization / edited by Bianca M. Colosimo and Enrique del Castillo by Colosimo, Bianca M Del Castillo, Enrique Publication details: Boca Raton : Chapman and Hall/CRC, 2007 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TS156.8.B397. Place hold
	3.	Advances in distribution theory, order statistics, and inference / N. Balakrishnan, Enrique Castillo, Jose Maria Sarabia, editors by International Conference on Distribution Theory, Order Statistics, and Inference (2004 : Universidad de Cantabria) Arnold, Barry C Balakrishnan, N, 1956- Castillo, Enrique, 1946- Sarabia, Jose-Maria International Conference on Distribution Theory Order Statistics and Inference 2004 Universidad de Cantabria Series: Statistics for industry and technology Publication details: Boston : Birkhauser, 2006 Online resources: Publisher description Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QA273.6.I584. Place hold
	4.	From Vectors to Tensors [electronic resource] / by Juan Ramon Ruiz-Tolosa, Enrique Castillo. by Ruiz-Tolosa, Juan Ramon Castillo, Enrique SpringerLink (Online service) Series: Universitext Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	5.	Process Optimization [electronic resource] : A Statistical Approach / by Enrique Del Castillo. by Del Castillo, Enrique SpringerLink (Online service) Series: International Series in Operations Research & Management Science ; 105 Publication details: Boston, MA : Springer Science+Business Media, LLC, 2007 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	6.	Run-to-run control in semiconductor manufacturing [electronic resource] / edited by James Moyne, Enrique del Castillo, Arnon Max Hurwitz by Moyne, James Del Castillo, Enrique Hurwitz, Arnon Max Publication details: Boca Raton : CRC Press, 2001 Online resources: Click here to access online CRCnetBASE Click here for the electronic version Availability: No items available.
	7.	Advances in Distribution Theory, Order Statistics, and Inference [electronic resource] / edited by N. Balakrishnan, Jose Maria Sarabia, Enrique Castillo. by International Conference on Distribution Theory, Order Statistics, and Inference (2004 : Universidad de Cantabria) Balakrishnan, N Castillo, Enrique Sarabia, Jose Maria SpringerLink (Online service) Series: Statistics for Industry and Technology Publication details: Boston, MA : Birkhauser Boston, 2006 In: Springer e-books Online resources: Click here to access online Availability: No items available.
	8.	A unified statistical methodology for modeling fatigue damage [electronic resource] / by Enrique Castillo, Alfonso Fernandez-Canteli. by Castillo, Enrique Fernandez-Canteli, Alfonso SpringerLink (Online service) Publication details: Dordrecht : Springer Netherlands, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available.

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