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Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy [microform] / by Paul Otto Braatz

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Publication details: Ann Arbor, Mich. : University Microfilms International , 1984Description: 5 microfiches ; 11 x 15 cmSubject(s):

Dissertation note: Thesis (Ph.D.) - University of California, 1984

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
TERHAD	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG MEDIA-P. TUN SERI LANANG (ARAS 2)	-	mikrofis tesis QC611.6.D4B72 1984 (Browse shelf(Opens below))		1	Available		00000722849

Thesis (Ph.D.) - University of California, 1984

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