Atomic force microscopy in process engineering : introduction to AFM for improved processes and products / [edited by] W. Richard Bowen and Nidal Hilal

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Publication details: Oxford : Butterworth-Heinemann, 2009Description: xvi, 283 p. : ill. ; 24 cmISBN:

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Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN LINGKUNGAN KEDUA	PERPUSTAKAAN LINGKUNGAN KEDUA KOLEKSI AM-P. LINGKUNGAN KEDUA	-	QH212.A78A867 3 (Browse shelf(Opens below))		1	Available		00002023969

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