Secondary ion mass spectometry : SIMS VI : proceedings of the sixth international conference on secondary ion mass spectrometry (SMIS VI) : palais des congres, Versailles, Paris, France September 13-18th, 1987 / editors A. Benninghoven ... (et al.).

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Publication details: Chichester : John Wiley & Sons 1988Description: 1078 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QD96.S43I58 1987 (Browse shelf(Opens below))		1	Available		00000174878

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