Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland

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Publication details: London : Taylor & Francis, 2001Edition: 3rd edDescription: x, 251 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QH212.E4G66 2001 (Browse shelf(Opens below))	n.3	1	Available	00001479687
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QH212.E4G66 2001 (Browse shelf(Opens below))	n.2	1	Available	00001479686
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QH212.E4G66 2001 (Browse shelf(Opens below))	n.1	1	Available	00001479685

Includes bibliographical references (p. [236]-237) and index

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