Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel, and Donald R. Beaman.

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Publication details: New York : Wiley, 1975Description: xiii, 474 pages. : illustrations. ; 26 cmISBN:

0471790206

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Item type	Current library	Home library	Collection	Call number	Materials specified	Copy number	Status	Date due	Barcode
AM	PERPUSTAKAAN TUN SERI LANANG	PERPUSTAKAAN TUN SERI LANANG KOLEKSI AM-P. TUN SERI LANANG (ARAS 5)	-	QH212.E4S53 (Browse shelf(Opens below))		1	Available		00000291447

Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.

'A Wiley biomedical-health publication.'

Includes bibliographical references and index.

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Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel, and Donald R. Beaman.

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