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CMOS SRAM circuit design and parametric test in nano-scaled technologies [electronic resource] : process-aware SRAM design and test / by Andrei Pavlov, Manoj Sachdev.
Series: Frontiers in electronic testing ; 40Publication details: Dordrecht : Springer Science + Business Media B.V, 2008.Description: 212 p. : ill., digital ; 24 cmISBN:- 9781402083631 (electronic bk.)
- 9781402083624 (paper)
- 621.38152 22
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