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1.
Accelerated reliability and durability testing technology / Lev M. Klyatis. by Series: Wiley series in systems engineering and management
Publication details: Hoboken, N.J. : Wiley, 2012
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TS173.K569 3.

2.
Accelerated testing : statistical models, test plans, and data analyses / Wayne Nelson by Series: Wiley series in probability and mathematical statistics. Applied probability and statistics
Publication details: New York : John Wiley & Sons, 1990
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QA276.N45.

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Accelerated testing : a practitioner's guide to accelerated and reliability testing / Bryan Dodson, Harry Schwab by
Publication details: Warrendale, Pa. : SAE International, 2006
Online resources:
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (2)Call number: TS173.D637 3, ...

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Advances in mathematical modeling for reliability / edited by Tim Bedford ... [et al.] by
Publication details: Amsterdam : IOS Press, 2008
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TA169.A348.

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Analyzing Computer System Performance with Perl::PDQ [electronic resource] / by Neil J. Gunther. by
Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2005
In: Springer e-books
Online resources:
Availability: No items available.

11.
Applied life data analysis / Wayne Nelson. by Series: Wiley series in probability and mathematical statistics. Applied probability and statistics.
Publication details: New York : Wiley, 1982
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (2)Call number: TS173.N44 3, ... PERPUSTAKAAN TUN SERI LANANG (1)Call number: TS173.N44.

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Applied life data analysis / Wayne B. Nelson by Series: Wiley series in probability and mathematical statistics | Wiley-Interscience paperback series
Publication details: Hoboken, N.J. : Wiley-Interscience, 2004
Availability: Items available for loan: PERPUSTAKAAN DR ABDUL LATIFF (1)Call number: TS173.N44 2004.

13.
Applied reliability / Paul A. Tobias, David C. Trindade by
Edition: 2nd ed.
Publication details: Boca Raton, Florida : Chapman & Hall/CRC, 1995
Availability: Not available: PERPUSTAKAAN TUN SERI LANANG: Checked out (1).

14.
Applied reliability / Paul A. Tobias, David C. Trindade. by
Edition: 3rd ed.
Publication details: Boca Raton, FL : CRC, 2012
Availability: Not available: PERPUSTAKAAN LINGKUNGAN KEDUA: Checked out (1).

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Applied Semi-Markov Processes [electronic resource] / by Jacques Janssen, Raimondo Manca. by
Publication details: Boston, MA : Springer Science+Business Media, Inc., 2006
In: Springer e-books
Online resources:
Availability: No items available.

17.
Architecting Dependable Systems III [electronic resource] / edited by Rogerio de Lemos, Cristina Gacek, Alexander Romanovsky by Series: Lecture Notes in Computer Science ; 3549
Publication details: Berlin Heidelberg : Springer-Verlag GmbH., 2005
Other title:
  • Architecting dependable systems 3
  • Architecting dependable systems three
In: Springer e-books
Online resources:
Availability: No items available.

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Architecting dependable systems VI [electronic resource] / edited by Rogerio de Lemos ... [et al.]. by Series: Lecture notes in computer science ; 5835
Publication details: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2009
In: Springer eBooks
Online resources:
Availability: No items available.

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