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21.
Capacitance measurement techniques applied to the study of deep levels in galium arsenide ( microform) / by Prahalad K. Vasudev by
Publication details: Ann Arbor, Mich. : University Microfilms International, 1977
Dissertation note: Thesis (Ph.D.) - Stanford University, 1977
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: mikrofis tesis QC611.8.G3V37.

22.
Carrier scattering in metals and semiconductors V. F. Gantmakher and Y. B. Levinson translation from the Russian by Nicholas Weinstein by Series: Modern problems in condensed matter sciences ; v. 19
Publication details: Amsterdam North-Holland 1987
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC176.8.E4G3613[00008027605].

23.
Characterization of semiconductor materials / Philip F. Kane, Graydon B. Larrabee by Series: Texas instruments electronics series
Publication details: New York : McGraw-Hill, 1970
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC612.S4K26.

24.
Characterization techniques for contaminated gate oxide [microform] / by Christakis Andrea Damianou by
Publication details: Ann Arbor, Mich. : University Microfilms International, 1991
Dissertation note: Thesis (Ph.D.) - University of Arizona, 1990
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7874.75.D35 1991 4mikrofis.

25.
Choosing and using ECL / Paul L. Matthews by
Publication details: London : Granada, 1983
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7871.85.M375.

26.
CMOS cookbook / by Don Lancaster by
Publication details: Carmel, Ind. : Sams, 1977
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.99.M44L36.

27.
CMOS devices and technology for VLSI / John Y. Chen by
Publication details: Englewood Cliffs, N.J. : Prentice-Hall International, 1990
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.99.M44C53.

28.
CMOS IC projects / by Delton T. Horn by
Publication details: Blue Ridge Summit, Pa. : TAB Books, 1988
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK9966.H67.

29.
Cohesive properties of semiconductors under laser irradiation / edited by Lucien D. Laude by Series: NATO ASI series. Series E, Applied sciences ; ; no. 69
Publication details: The Hague : Martinus Nijhoff, 1983
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: QC611.6.R3N37[00008040814], ...

30.
Colour centres and imperfections in insulators and semiconductors / / P. D. Townsend and J. C. Kelly by
Publication details: London : Chatto & Windus, 1973
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC176.8.O6T68[00008027644].

31.
Complete guide to semiconductor devices / Kwok K. Ng by
Publication details: New York : McGraw-Hill, 1995
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.85.N49.

32.
Computational modeling in semiconductor processing / M. Meyyappan, editor by
Publication details: Norwood, MA. : Artech House, 1995
Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.85.C583.

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Crystalline semiconducting materials and devices / edited by Paul N. Butcher, Norman H. March and Mario P. Tosi by
Publication details: New York : Plenum Press, 1986
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: QC610.9.C79, ...

36.
Current injection in solids / by Murray A. Lampert and Peter Mark by Series: Electrical science
Publication details: New York : Academic Press, 1970
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: QC176.8.E35L3.

37.
Deep impurities in semiconductors / A. G. Milnes by
Publication details: New York : John Wiley & Sons, 1973
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (4)Call number: QC611.M644, ...

38.
Deep level transient spectroscopy characterization of semiconductors ( microform) by Wei-I Lee by
Publication details: Ann Arbor, Mich. University Microfilms International 1989
Dissertation note: Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1988
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7871.85.W44 1989 4mikrofis.

39.
Deep levels in semiconductors / M. Jaros by
Publication details: Bristol : Hilger, 1982
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: QC611.8.D5J3[00008040819], ...

40.
Deep-level transient spectroscopy studies of galium-arsenide - aluminium-galium - arsenide heterostructures and superlattices [microform] / by Paul Alan Martin by
Publication details: Ann Arbor, Mich. : University Microfilms International , 1986
Dissertation note: Thesis (Ph.D.) - University of Illinois, 1986
Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: mikrofis tesis QC611.8.G3M27 1986.

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