Results of search for 'ccl=su:"Scale"' › Opac Gemilang catalog

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	161.	Statistical size distributions in economics and actuarial sciences / Christian Kleiber, Samuel Kotz by Kleiber, Christian, 1966- Kotz, Samuel Series: Wiley series in probability and statistics Publication details: Hoboken, NJ : Wiley, 2003 Online resources: Publisher description Table of contents Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (2)Call number: HB523.K53, ... Place hold
	162.	Stochastic large-scale engineering systems / edited by Spyros G. Tzafestas, Keigo Watanabe. by Tzafestas, Spyros G Watanabe, Keigo Series: Electrical engineering and electronics ; 79. Publication details: New York : Marcel Dekker, 1992 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TA168 .S76 3 . Place hold
	163.	No cover image available Structured built-in test for LSI/VLSI chips based on random patterns (microform) / Hsu Yi-Jen. by Hsu, Yi-Jen Publication details: Ann Arbor, Mich.: University Microfilms International, 1986 Dissertation note: Thesis (Ph.D.)-Auburn University, 1986 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7874.75.H78 1986 4mikrofis. Place hold
	164.	Symbolic Analysis and Reduction of VLSI Circuits [electronic resource] / by Zhanhai Qin, Sheldon X. D. Tan, Chung-Kuan Cheng. by Qin, Zhanhai Tan, Sheldon X. D Cheng, Chung-Kuan SpringerLink (Online service) Publication details: Boston, MA : Springer Science + Business Media, Inc., 2005 In: Springer e-books Online resources: Click here to access online Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: ebook. Place hold
	165.	Systems of systems engineering [electronic resource] : principles and applications / edited by Mo Jamshidi by Jamshidi, Mohammad Publication details: Boca Raton, FL : CRC Press/Taylor & Francis Group, 2009 Online resources: Click here to access online CRCnetBASE Click here for the electronic version Availability: No items available.
	166.	No cover image available Techniques to speedup test generation for VLSI circuits (microform) Susheel Jagdish Chandra by Chandra, Susheel Jagdish Publication details: Ann Arbor, Mich. University Microfilms International 1990 Dissertation note: Thesis (Ph.D.)-University of Illinois, 1990 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7874.75.C42 1990 4mikrofis. Place hold
	167.	No cover image available Technology and application of aligned wafer bonding for three dimensional microstructures and microdevices / by Mohd Salleh Ismail. by Mohd. Salleh Ismail Publication details: Davis, Calif: University of California, 1993 Dissertation note: Thesis (Doctor of Philosophy) - University of California, 1993. Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7871.85.M84 4. Place hold
	168.	No cover image available Technology and application of aligned wafer bonding for three dimensional microstructures and microdevices [microform] / by Mohd Salleh Ismail by Mohd. Salleh Ismail Publication details: Davis, Calif. Perpustakaan Tun Seri Lanang, 2006 Dissertation note: Thesis (Doctor of Philosophy) - University of California, 1993 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: mikrofilem tesis TK7871.85.M84 2006. Place hold
	169.	No cover image available Tennessee self-concept scale : TSCS:2 : manual / W. H. Fitts and W. L. Warren by Fitts, W. H Warren, W. L Edition: 2nd ed. Publication details: Los Angeles, CA : western Psychological Services, 1996 Other title: TSCS-2 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: BF697.5.S43 F58 1996. Place hold
	170.	No cover image available Testability analysis and test generation for sequential VLSI circuits (microform) / Raghu Vishwanath Hudli by Hudli, Raghu Vishwanath Publication details: Ann Arbor, Mich. : University Microfilms International, 1990 Dissertation note: Thesis (Ph.D.)-University of Nebraska-Lincoln, 1990 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7874.75.H82 1990 4mikrofis. Place hold
	171.	No cover image available Testable structures for CMOS VLSI circuits (microform) / Liu Dick Li-Ta by Liu, Dick Li-Ta Publication details: Ann Arbor, Mich. : University Microfilms International, 1987 Dissertation note: Thesis (Ph.D.)-Stanford University, 1987 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (1)Call number: TK7874.75.L58 1987 4mikrofis. Place hold
	172.	Testing and reliable design of CMOS circuits by Niraj K. Jha and Sandip Kundu by Jha, Niraj K Kundu, Sandip Publication details: Boston Kluwer Academic Publishers 1990 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7871.99 .M44J49. Place hold
	173.	No cover image available A theory and procedure of scale analysis : with applications in political research / by R.J.Mokken. by Mokken, R.J, 1929- Series: Methods and models in the social sciences ; 1 Publication details: The Hague : Mouton, 1971 Availability: Items available for loan: PERPUSTAKAAN TUN SERI LANANG (3)Call number: JA73 .M63, ... Place hold
	174.	No cover image available Third Caltech Conference on Very Large Scale Integration editor Randal Bryant. by Caltech Conference on Very Large Scale Integration (3rd : 1983 : Pasedena, Calif.) Bryant, Randal California Institute of Technology Publication details: Berlin : Springer-Verlag, 1983 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874 .C28 1983. Place hold
	175.	Timing optimization through clock skew scheduling [electronic resource] / by Ivan S. Kourtev, Baris Taskin, Eby G. Friedman. by Kourtev, Ivan S Friedman, Eby G Taskin, Baris SpringerLink (Online service) Publication details: Boston, MA : Springer US, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available.
	176.	Total quality management (TQM) implementation for small and medium enterprises : strategy for competitiveness / Azizan Abdullah, Zaini Abdullah. by Azizan Abdullah Zaini Abdullah Publication details: Shah Alam : Pusat Penerbitan Universiti (UPENA), Universiti Teknologi. Availability: Items available for loan: PERPUSTAKAAN ALAM DAN TAMADUN MELAYU (1)Call number: HD62.15.A95 8. Place hold
	177.	Tutorial, test generation for VLSI chips edited by Vishwani D. Agrawal and Sharad C. Seth by Agrawal, Vishwani D, 1943- Seth, Sharad C IEEE Computer Society Publication details: Washington, D.C. IEEE computer Society 1988 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.T8857. Place hold
	178.	ULSI devices / edited by C.Y. Chang, S.M. Sze by Chang, C.-Y Sze, S. M, 1936- Publication details: New York : Wiley, 2000 Online resources: Contributor biographical information Publisher description Table of Contents Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874.76.U47 3. Place hold
	179.	Unified methods for VLSI simulation and test generation by Kwang-Ting Cheng and Vishwani D. Agrawal. by Cheng, Kwang-Ting, 1961- [author.] Agrawal, Vishwani D, 1943- [author.] Publication details: Boston: Kluwer Academic Publishers, 1989 Availability: Items available for loan: PERPUSTAKAAN LINGKUNGAN KEDUA (1)Call number: TK7874. C525. Place hold
	180.	Unleash the system on chip using FPGAs and Handel C [electronic resource] / by Rajanish K. Kamat, Santhosh A. Shinde, Vinod G. Shelake. by Kamat, Rajanish K Shinde, Santhosh A Shelake, Vinod G SpringerLink (Online service) Publication details: Dordrecht : Springer Netherlands, 2009 In: Springer eBooks Online resources: Click here to access online Availability: No items available.

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