Lee, Jack Chung-Yeung <br/><br/>
High-field reliability of MOS devices  [microform] / 
Jack Chung-Yeung Lee 
 - Ann Arbor, Mich. :  University Microfilms International,  1989 
 - 2 microfiches ;  11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - University of California, 1988 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors<br/>Metal oxide semidonductors--Field--effect transistor