TY  - BOOK
AU  - Bhattacharya,Debashis
AU  - Hayes,John P.
TI  - Hierarchical modeling for VLSI circuit testing
SN  - 079239058X
PY  - 1990///
CY  - Boston
PB  - Kluwer Academic Publishers
KW  - Integrated circuits
KW  - Very large scale integration
KW  - Testing
KW  - Computer simulation
ER  -