TY  - BOOK
AU  - Feldman,Leonard C.
AU  - Mayer,J.W.
TI  - Fundamentals of surface and thin film analysis
SN  - 6044400982
PY  - 1986///
CY  - New York
PB  - North-Holland
KW  - Surface (Technology)
KW  - Analysis
KW  - Thin films
ER  -