Feldman, Leonard C. <br/><br/>
Fundamentals of surface and thin film analysis / 
by Leonard G. Feldman and James W. Mayer 
 - New York :  North-Holland,  1986 
 - 352 p. :  c23  cm.  ill. ; 
<br/><br/><label>ISBN: </label>6044400982 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Surface (Technology)--Analysis<br/>Thin films--Analysis