Ramakrishnan, T. <br/><br/>
Fast fault simulation and compact test generation  [microform] 
by T. Ramakrishnan 
 - Ann Arbor, Mich.  University Microfilms International  1991 
 - 2 microfiches ; 11 x 15 cm. 
<br/><br/>Thesis (Ph.D.)-University of Minnesota