Extreme value modeling and risk analysis :  methods and applications / 
edited by Dipak K. Dey, Jun Yan. 
 - Boca Raton, FL :  CRC Press, Taylor & Francis Group,  2016. 
 - xx, 520 p. :  ill. ;  24 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781498701297  RM373.35 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Extreme value theory.