TY  - BOOK
AU  - Mendis,Budhika G.
TI  - Electron beam-specimen interactions and simulation methods in microscopy
T2  - Royal Microscopical Society - John Wiley series
SN  - 9781118456095
PY  - 2018///
CY  - Hoboken, NJ
PB  - John Wiley & Sons Ltd
KW  - Microscopy, Electron
N1  - Includes bibliographical references and index
ER  -