Mendis, Budhika G., <br/><br/>
Electron beam-specimen interactions and simulation methods in microscopy / 
Budhika G. Mendis. 
 - x, 279 pages :  illustrations ;  2018. 
 - Royal Microscopical Society - John Wiley series .
 - Royal Microscopical Society - John Wiley series .
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781118456095  RM463.68 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy, Electron.