Conductive atomic force microscopy :  applications in nanomaterials / 
edited by Mario Lanza. 
 - xix, 359 pages :  illustrations ;  25 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9783527340910  RM792.12 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Microscopy, Atomic Force.