X-ray diffraction imaging :  technology and applications / 
edited by Joel Greenberg, managing editor Krzysztof Iniewski. 
 - xxi, 255 pages :  illustrations ;  24 cm. 
 - Taylor and Francis series in devices, circuits, & systems .
<br/><br/>Includes bibliographical references. 
<br/><br/><label>ISBN: </label>9781498783613  RM562.33 
<br/><br/><label>LCCN: </label>2018-027858 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-ray diffraction imaging.<br/>Radiography, Industrial.<br/>Detectors--Equipment and supplies.<br/>Refractometers.