Reliability of photovoltaic cells, modules, components, and systems VI : proceedings of SPIE held in San Diego, California, United States, 26-29 August 2013 /
Proceedings of SPIE, Society of Photo-Optical Instrumentation Engineers.
editors, Neelkanth G. Dhere, John H. Wohlgemuth, Kevin W. Lynn.
- 1 volume (various pagings) ; 27 cm.