TY  - BOOK
AU  - Berthold,John William,III
TI  - Dimensional stability of low expansivity materials (microform): time dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics 
PY  - 1976///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Steel
KW  - Electrometallurgy
KW  - Electric properties
N1  - Thesis (Ph.D.)-University of Arizona, 1976
ER  -