Berthold, John William, III,  1945- <br/><br/>
Dimensional stability of low expansivity materials (microform) :  time dependent changes in optical contact interfaces and phase shifts on reflection from multilayer dielectrics / 
by John William Berthold III 
 - Ann Arbor, Mich. :  University Microfilms International ,  1976 
 - 1 microfiche ; 11 x 15 cm. 
<br/><br/>Thesis (Ph.D.)-University of Arizona, 1976 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Steel--Electrometallurgy<br/>Steel--Electric properties