Digest of papers : 1996 IEEE international workshop on IDDQ testing, October 24-25, 1996, Washington, D.C. - IEEE International Workshop on IDDQ Testing (1996 : Washington, D.C.); Tong, Carol; Jayasumana, Anura (Los Alamitos, Ca. : IEEE Computer Society Press, 1996)
Includes bibliographical references and index.
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Keywords: Iddq testing -- Congresses; Metal oxide semiconductors, Complementary -- Congresses