Diffraction and imaging techniques in material science / 
editors, S. Amelinckx, R. Gevers, J. Van Landuyt 
 - 2d, rev. ed. 
 - Amsterdam :  North-Holland Publishing Company,  1978 
 - 2 v. (xvii, 847 p.,  1  fold. leaf of plates) :  ill. ;  23 cm. 
<br/><br/> Comprises new contributions and revised and updated papers originally presented at the International Summer Course on Material Science, Antwerp, 1969, and published in 1970 under title: Modern diffraction and imaging techniques in material science 
<br/><br/>Includes bibliographical references and indexes 
<br/><br/>v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques 
<br/><br/><label>ISBN: </label>0444851305 
<br/><br/><label>LCCN: </label>78-022081 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electron microscopy--Congresses<br/>Electrons--Diffraction--Congresses<br/>Imaging systems--Congresses<br/>Materials--Microscopy