Polycrystalline semiconductors V : bulk materials, thin films and devices : proceedings of the fifth International Conference, held in Schwäbisch Gmünd, Germany, September 13-18, 1998 /
POLYSE'98.
editors, J.H. Werner, H.P. Strunk, H.W. Schock.
- xvi, 597 pages : illustrations ; 25 cm.
- Diffusion and defect data, solid state data. Part B, solid state phenomena, no. 67-68 0377-6883 ; .
- Diffusion and defect data, solid state data. Part B, solid state phenomena, no. 67-68 .