Defect control in semiconductors :  proceedings of the international conference on the science and technology of defect control in semiconductors, the Yokohama 21st century forum, Yokohama, Japan September 17-22, 1989 / 
edited by K. Sumino 
 - Amsterdam :  North-Holland,  1990 
 - v.: ill. ;  28 cm. 
<br/><br/>Includes bibliographical references and indexes 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Defects--Congresses<br/>Materials--Defects--Congresses