TY  - BOOK
AU  - Sundaram,Lalgudi M.G.
TI  - Defect characterization in semiconductors by deep level transient spectroscopy
PY  - 1985///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Semiconductors
KW  - Defects
N1  - Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1984
ER  -