Sundaram, Lalgudi M. G. <br/><br/>
Defect characterization in semiconductors by deep level transient spectroscopy  [microform] / 
by Lalgudi M. G. Sundaram 
 - Ann Arbor, Mich. :  University Microfilms International ,  1985 
 - 3 microfiches ;  11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - Rensselaer Polytechnic Institute, 1984 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Defects