TY  - BOOK
AU  - Braatz,Paul Otto
TI  - Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy
PY  - 1984///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Semiconductors
KW  - Defects
N1  - Thesis (Ph.D.) - University of California, 1984
ER  -