Braatz, Paul Otto <br/><br/>
Defect analysis in high-resistivity semiconductors by transient deep-level spectroscopy  [microform] / 
by Paul Otto Braatz 
 - Ann Arbor, Mich. :  University Microfilms International ,  1984 
 - 5 microfiches ;  11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - University of California, 1984 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductors--Defects