TY  - BOOK
AU  - Troxell,John Richard
TI  - Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform)
PY  - 1980///
CY  - Ann Arbor, Mich.
PB  - University Microfilms International
KW  - Silicon
KW  - Defects
N1  - Thesis (Ph.D.) - Lehigh University, 1979
ER  -