Troxell, John Richard <br/><br/>
Deep level transient spectroscopy studies of radiation induced defects in silicon ( microform) 
by John Richard Troxell 
 - Ann Arbor, Mich.  University Microfilms International  1980 
 - 4 microfiches ; 11 x 15 cm. 
<br/><br/>Thesis (Ph.D.) - Lehigh University, 1979 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Silicon--Defects