TY  - BOOK
AU  - Muhammad Faiz Bukhori.
TI  - Simulation of charge-trapping in nano-scale mosfets in the presence of random-dopants-induced variability
PY  - 2011///
CY  - Glascow
PB  - University of Glascow
KW  - Metal oxide semiconductor field-effect transistors
KW  - Nanoelectronics
KW  - Semiconductors
N1  - Thesis (Ph. D.) - University of Glascow, 2011
ER  -