Muhammad Faiz Bukhori. <br/><br/>
Simulation of charge-trapping in nano-scale mosfets in the presence of random-dopants-induced variability / 
Muhammad Faiz Bukhori. 
 - Glascow :  University of Glascow,  2011 
 - xix, 164 p. :  ill. ;  30 cm. 
<br/><br/>Thesis (Ph. D.) - University of Glascow, 2011 
<br/><br/><label>ISBN: </label> Hadiah 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductor field-effect transistors.<br/>Nanoelectronics.<br/>Semiconductors.