Dosch, Helmut,  1955- <br/><br/>
Critical phenomena at surfaces and interfaces :  evanescent x-ray and neutron scattering / 
Helmut Dosch 
 - Berlin :  Springer-Verlag,  1992 
 - x, 145 p. :  ill. ;  25 cm. 
 - Springer tracts in modern physics ;  vol. 126 .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>3540545344 
<br/><br/><label>LCCN: </label>91-037384 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Surfaces (Physics)--Optical properties<br/>Critical phenomena (Physics)<br/>X-rays--Scattering<br/>Neutrons--Scattering<br/>Grazing incidence