TY  - BOOK
AU  - Zhao,Yi
TI  - Wafer level reliability of advanced CMOS devices and processes
SN  - 9781604567137 (hbk.)
PY  - 2008///
CY  - New York
PB  - Nova Science Publishers
KW  - Metal oxide semiconductors, Complementary
N1  - Includes bibliographical references and index
ER  -