Wafer level reliability of advanced CMOS devices and processes / 
Yi Zhao, editor 
 - New York :  Nova Science Publishers,  2008 
 - 195 p. :  ill. ;  27 cm. 
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9781604567137 (hbk.)  RM242.53 1604567139 (hbk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary