Characterization in compound semiconductor processing / 
 Compound semiconductor processing. 
editors, Yale Strausser and Gary E. McGuire. 
 - New York:  Momentum Press ,  2010. 
 - xvi, 199 p. :  ill. ;  25 cm 
 - Materials characterization series. .
 - Materials characterization series. .
<br/><br/> 'First published by Butterworth-Heinemann in 1995'. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9781606500415  RM233.94 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Compound semiconductors.<br/>Compound semiconductors--Surfaces.